on-wafer chip testing — plokštelės lustų tikrinimas statusas T sritis radioelektronika atitikmenys: angl. on wafer chip testing vok. Chiptesten auf dem Wafer, n; On Wafer Chiptesten, n rus. проверка кристаллов ИС на пластине, f pranc. test des puces in situ, m … Radioelektronikos terminų žodynas
Chip Ganassi Racing — Not to be confused with Earnhardt Ganassi Racing. Chip Ganassi Racing with Felix Sabates Owner(s) Chip Ganassi Felix Sabates Base Indianapolis Indiana … Wikipedia
Chip carrier — A standard sized 8 pin dual in line package (DIP) containing a 555 timer IC. A chip carrier, also known as a chip container or chip package, is a container for a transistor or an integrated circuit. The carrier usually provides metal leads, or… … Wikipedia
chip — 1 /tSIp/ noun (C) 1 MARK a small hole or mark on a plate, cup etc where a piece has broken off (+ in): There s a chip in this plate. 2 PIECE a small piece of wood, stone, metal etc that has broken off something: Wood chips covered the floor of… … Longman dictionary of contemporary English
Design for testing — Design for Test (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and… … Wikipedia
Flexible Architecture for Simulation and Testing — The FAST Project is a new hybrid hardware prototyping platform enabled by integrating a variety of hardware components on a printed circuit board (PCB) to implement Chip Multiprocessor (CMP) or Multiprocessor (MP) systems. The Flexible… … Wikipedia
Jipi and the Paranoid Chip — is a science fiction short story by Neal Stephenson that appeared in Forbes Magazine s July 7 1997 issue. It is part of the Baroque Cycle/ Cryptonomicon universe.PlotThe story deals with the concepts of mindshare and evolutionary software; a Thai … Wikipedia
Lab-on-a-chip — This article is about the technology. For the journal, see Lab on a Chip (journal). Lab on a chip made of glass A lab on a chip (LOC) is a device that integrates one or several laboratory functions on a single chip of only millimeters to a few… … Wikipedia
Iddq testing — is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current (Idd) in the quiescent state (when the circuit is not switching and inputs are held at static values). The… … Wikipedia
Digital video testing — in broadcast video, for example, is the process of validating and verifying that the video content and other data is being correctly processed, stored and transported. Despite the fact that the data is digital, most digital tv (DTV) system… … Wikipedia
Stress testing — is a form of testing that is used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity, often to a breaking point, in order to observe the results. Stress testing may have a more specific… … Wikipedia